09:00 -- Opening, Slides. 09:05 -- Keynote - Paul Ammann: “Transforming Mutation Testing from the Technology of the Future into the Technology of the Present”, Slides.
10:10 -- Paper Session1 (1 paper) - Pei Gong, Ruilian Zhao and Zheng Li, “Faster Mutation-based Fault Localization With A Novel Mutation Execution Strategy”, Slides.
10:30 -- Break
11:00 -- Paper Session2 (5 papers) - Jay Nanavati, Fan Wu, Mark Harman, Yue Jia and Jens Krinke, “Mutation Testing of Memory-Related Operators”, Slides.
- Lin Deng, Nariman Mirzaei, Paul Ammann and Jeff Offutt, “Towards Mutation Analysis of Android Apps”, Slides.
- Matthew Patrick and Yue Jia, “Kernel Density Adaptive Random Testing”, Slides.
- Paolo Arcaini, Angelo Gargantini, Elvinia Riccobene and Paolo Vavassori, “Rehabilitating equivalent mutants as static anomaly detectors in software artifacts”, Slides.
- Nan Li, Michael West, Anthony Escalona and Vinicius Durelli, “Mutation Testing in Practice using Ruby”, Slides.
12:30 -- Lunch 14:00 -- Discussion and Best paper Award - Discussion panel “What makes a successful tool, how do we measure the tool effectiveness and how do we bridge the gap between research and industry tools?”
Panel members:
Jeff Offutt, George Mason University, USA, Slides. Yue Jia, University College London, UK, Slides. Mark Harman, University College London, UK, Slides. 15:00 -- Break
15:30 -- Paper Session3 (4 papers) - Robert Kurtz, Paul Ammann and Jeff Offutt, “Static Analysis of Mutant Subsumption”, Slides.
- Javier Troya, Alexander Bergmayr, Loli Burgueño and Manuel Wimmer, “Systematic Mutations for and with ATL Model Transformations”, Slides.
- Birgitta Lindström, Sten F Andler, Jeff Offutt, Paul Pettersson and Daniel Sundmark, “Mutating Aspect-Oriented Models to Test Cross-Cutting Concerns”, Slides.
- Rafael A. P. Oliveira, Emil Alégroth, Zebao Gao and Atif Memon “Definition and Evaluation of Mutation Operators for GUI-level Mutation Analysis”, Slides.
17:00 -- End of Program
18:30 -- Social dinner offered by CREST.
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